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Electrical Test Specification and Procedures 

USB 2.0 Electrical Test Procedures for Rohde & Schwarz Test Equipment
High-Speed Electrical Test Procedures for Tektronix Test Equipment
High-Speed Electrical Test Procedures for Agilent Test Equipment
High-Speed Electrical Test Procedures for LeCroy Test Equipment
High-Speed Electrical Test Procedures for Yokogawa Test Equipment
USB 2.0 Electrical Test Specification (Version 1.06)
USB High-Speed Electrical Test Tool
USB-IF Full and Low Speed Electrical and Interoperability Compliance Test Procedure
High-speed Embedded Host Electrical Test device (HSEHET)

Drop Droop Test Procedures




Compliance Test Procedures for High-Speed USB Products

Each set documents the high-speed electrical tests required for the compliance program. Please determine which set of procedures meet your need based on your test equipment choice.NOTE:  Some of the following approved test solutions use proprietary software to assess signal quality and inrush current events.  The only official analysis tool for certifying signal quality and inrush current is USBET20 published by the USB-IF.  Please be sure to run captured signal quality and inrush current test data through USBET for an official assessment of the measurement.

USB 2.0 Electrical Test Procedures for Rohde & Schwarz RTO1024, RTO1044
Device, Hub, and Host Test Procedure (pdf, 27MB) - for Rohde & Schwarz Test Equipment

Tektronix USB 2.0 Electrical Test Documents

High-speed Electrical Test Procedures for Tektronix TDS7254/B, TDS7704/B, CSA7404/B, TDS6604/B, TDS6804/B, TDS6404, DPO7254, DPO7354, and DPO/DSA70000 series

High-Speed Electrical Test Procedures for Tektronix Test Equipment TDS 694C, DG2040 (Version 1.0)

High-Speed Electrical Test Procedures for Agilent Test Equipment 54853, 54854, and 54855 (Version 1.2)

High-Speed Electrical Test Procedures for Agilent Test Equipment 54846 and 1131 (Version 1.1)

High-Speed Electrical Test Procedures for Agilent Test Equipment (Version 1.0)

High-Speed Electrical Test Procedures for Agilent Test Equipment DSO80000A/B series, 548XXA series, Infiniium 90000 series and Infiniium 9000 series oscilloscopes using the N5416A USB 2.0 Compliance Test SW.

High-Speed Electrical Test Procedures for LeCroy Test Equipment WaveRunner, WavePro, WaveMaster and SDA using QualiPHY USB

High-Speed Electrical Test Procedures for LeCroy Test Equipment WaveMaster and SDA (Version 1.0)

High-Speed Electrical Test Procedures for Yokogawa Test Equipment DL9240/DL9240L/DL6154 (Version 2.0)

USB 2.0 Electrical Test Specification (Version 1.06)

The USB 2.0 Electrical Test Specification (pdf, 194k) defines a set of electrical test criteria for USB 2.0 products. The compliance criteria are provided as a list of test assertions that describe specific characteristics or behaviors that must be met for USB 2.0 new silicons. Many though not all of the assertions are verified in the high-speed electrical test procedures.

USB High-Speed Electrical Test Tool

The USB High-Speed Electrical Test Tool is a test utility designed to facilitate the high-speed electrical tests. This test utility is required to perform each of the high-speed electrical test procedures. The USB High Speed Electrical Test Tool is a part of the USB High-Speed Electrical Test Tool Kit installation USBHSET.MSI which also including the setup instruction for configuring a High-Speed Signal Quality Analysis Computer and a High-Speed Electrical Test Bed Computer. Included in this installation are also GPIB-DAQ and the Matlab USB analysis script. This tool kit is provided in courtesy of Intel® Corporation.

USB-IF Full and Low Speed Electrical and Interoperability Compliance Test Procedure

This USB-IF Compliance Test Procedure (pdf, 1.3MB) was developed for all USB products before the advent of high-speed USB products. It documents the required compliance test of full-speed and low-speed signal quality, power delivery. Full speed electrical tests still apply to high speed devices. It documents interoperability tests for all device speeds. These tests are required for high-speed, full-speed, and low-speed USB products. The high speed electrical tests are documented in the USBHSET installation package. This document was updated on February 9, 2004.

USB-IF Embedded Host Compliance Procedures

Embedded hosts may be certified provided they meet specific criteria. Please refer to the USB On-The-Go and Embedded Host page. 

A High-speed Embedded Host Electrical Test device (HSEHET) made specifically for initiating these test modes is available.  The HSEHET device may be used as an alternative to the OPT for initiating test modes on embedded hosts.  Please see the HSEHET webpage for ordering information.


Drop Droop Test Procedrues

The USB 2.0/3.1 Droop/Drop Test Procedures for non-USB Type-C™ Products version 1.3 is available at here.