USB 3.1 Specification
Universal Serial Bus Revision 3.1 Specification (.zip file format, size 37.7 MB) provides the technical details to understand USB 3.1 requirements and design USB 3.1 compatible products. Modifications to the USB 3.1 specification are made through Engineering Change Notices (ECNs). Enclosed in this zip file are the following documents:
THIS SPECIFICATION IS PROVIDED "AS IS" AND WITHOUT ANY WARRANTY OF ANY KIND, EXPRESSED OR IMPLIED. WITHOUT LIMITATION, THERE IS NO WARRANTY OF NON-INFRINGEMENT, NO WARRANTY OF MERCHANTABILITY, AND NO WARRANTY OF FITNESS FOR A PARTICULAR PURPOSE. ALL WARRANTIES ARE EXPRESSLY DISCLAIMED.
USER ASSUMES THE FULL RISK OF USING THIS SPECIFICATION. IN NO EVENT SHALL USB-IF BE LIABLE FOR ANY ACTUAL, DIRECT, INDIRECT, PUNITIVE, OR CONSEQUENTIAL DAMAGES ARISING FROM SUCH USE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGES.
USB 3.0 Adopters Agreement
USB 3.0 Specification
USB 3.0 white papers referenced in this specification can be found here.
USB Device Class Specifications. Building on top of the USB specifications, there are Device Class Specifications from the Device Working Group. These specifications recommend design targets for classes of devices. For HID related information, please go to the HID Web page.
Intellectual Property Rights Notices
Notice to all readers: The USB-IF is providing this information as a courtesy to our members 'AS IS' and without warranty of any kind. The USB-IF is not responsible for content of the individual postings. The USB-IF will not be responsible for identifying patents for which a license may be required by a USB Specification nor for conducting inquiries into the legal validity or scope of those patents that are brought to its attention.
USB Technical Documents
These are some resources useful to USB developers:
High Speed USB Platform Design Guidelines (.pdf file format, size 298k) This document provides guidelines for integrating a high-speed USB host controller onto a 4-layer desktop motherboard. It covers board design, EMI/ESD, and front panel USB guidelines.
Requirements and Recommendations for USB Products with Embedded Hosts and/or Multiple Receptacles (.pdf file format, size 289k) will assist developers of products that don't fall into the traditional categories of host, hub or peripheral. An ever-increasing number of USB peripherals are being designed with more than a single device port, some including host ports that are intended to support only a limited set of peripherals.
USB-IF Compliance is expanding its coverage to ensure more complete testing of these types of products.
USB-IF Compliance Test Procedures
Compliance Test Procedures for High-Speed USB Products
Each set documents the high-speed electrical tests required for the compliance program. Please determine which set of procedures meet your need based on your test equipment choice.NOTE: Some of the following approved test solutions use proprietary software to assess signal quality and inrush current events. The only official analysis tool for certifying signal quality and inrush current is USBET20 published by the USB-IF. Please be sure to run captured signal quality and inrush current test data through USBET for an official assessment of the measurement.
High-speed Electrical Test Procedures for Tektronix TDS7254/B, TDS7704/B, CSA7404/B, TDS6604/B, TDS6804/B, TDS6404, DPO7254, DPO7354, and DPO/DSA70000 series
High-Speed Electrical Test Procedures for Tektronix Test Equipment TDS 694C, DG2040 (Version 1.0)
High-Speed Electrical Test Procedures for Agilent Test Equipment 54853, 54854, and 54855 (Version 1.2)
High-Speed Electrical Test Procedures for Agilent Test Equipment 54846 and 1131 (Version 1.1)
High-Speed Electrical Test Procedures for Agilent Test Equipment (Version 1.0)
High-Speed Electrical Test Procedures for Agilent Test Equipment DSO80000A/B series, 548XXA series, Infiniium 90000 series and Infiniium 9000 series oscilloscopes using the N5416A USB 2.0 Compliance Test SW.
High-Speed Electrical Test Procedures for LeCroy Test Equipment WaveRunner, WavePro, WaveMaster and SDA using QualiPHY USB
High-Speed Electrical Test Procedures for LeCroy Test Equipment WaveMaster and SDA (Version 1.0)
High-Speed Electrical Test Procedures for Yokogawa Test Equipment DL9240/DL9240L/DL6154 (Version 2.0)
High-Speed Electrical Test Specification (Version 1.03)
The High-Speed Electrical Test Specification (pdf, 194k) defines a set of electrical test criteria for USB 2.0 products. The compliance criteria are provided as a list of test assertions that describe specific characteristics or behaviors that must be met for USB 2.0 new silicons. Many though not all of the assertions are verified in the high-speed electrical test procedures.
USB High-Speed Electrical Test Tool
The USB High-Speed Electrical Test Tool is a test utility designed to facilitate the high-speed electrical tests. This test utility is required to perform each of the high-speed electrical test procedures. The USB High Speed Electrical Test Tool is a part of the USB High-Speed Electrical Test Tool Kit installation USBHSET.MSI which also including the setup instruction for configuring a High-Speed Signal Quality Analysis Computer and a High-Speed Electrical Test Bed Computer. Included in this installation are also GPIB-DAQ and the Matlab USB analysis script. This tool kit is provided in courtesy of Intel® Corporation.
USB-IF Full and Low Speed Electrical and Interoperability Compliance Test Procedure
This USB-IF Compliance Test Procedure (pdf, 1.3MB) was developed for all USB products before the advent of high-speed USB products. It documents the required compliance test of full-speed and low-speed signal quality, power delivery. Full speed electrical tests still apply to high speed devices. It documents interoperability tests for all device speeds. These tests are required for high-speed, full-speed, and low-speed USB products. The high speed electrical tests are documented in the USBHSET installation package. This document was updated on February 9, 2004.
USB-IF Embedded Host Compliance Procedures
Embedded hosts may be certified provided they meet specific criteria. Please refer to the USB On-The-Go and Embedded Host page.
A High-speed Embedded Host Electrical Test device (HSEHET) made specifically for initiating these test modes is available. The HSEHET device may be used as an alternative to the OPT for initiating test modes on embedded hosts. Please see the HSEHET webpage for ordering information.
USB Current Adapters
The USB-IF is providing a limited number of USB current adapters to USB-IF member companies while supplies last.
A USB device can store strings in multiple languages. i.e. the string index defines which word or phrase should be communicated to the user (like "Format" or "Insert Disk") and the LANGID code identifies to a device, which language (German, Chinese, etc.) to retrieve that word or phase for. Here is a list of LANGIDs (.pdf file format, size 34k) defined for USB devices.
Note: To support forward compatibility, system software must allow the enumeration and selection of LANGIDs that are not currently on this list. And system software should never request a LANGID not defined in the LANGID code array (string index = 0) presented by a device.
Presentations from our past conferences are downloadable from this page in case you have not been able to attend.
There are USB technical "White Papers" on various topics written by the Spec authors and other industry experts. These are provided as additional guidance and do not constitute official USB-IF collateral.