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USB-IF eStore Details

Prior to purchasing products from the USB-IF, please review our return policy and legal disclaimer.

USB 3.0 xHCI-based PDK

The USB 3.0 xHCI-based Peripheral Development Kit (PDK) provides two host-side solutions. It is intended to assist companies who are developing peripherals. For more information about what is shipped with the USB 3.0 xHCI-based PDK, please click here.

The PDK is available for purchase for US$1,500. To purchase the PDK, please complete the PDK Product Order Form and fax or mail it to the address provided on the form.

Due to a limited supply, companies must meet certain eligibility criteria in order to purchase a PDK.

USB-IF Peripheral Development Kit (PDK) for Wireless USB

WHCI-based PCI add-in card

The USB-IF Peripheral Development Kit (PDK) for Wireless USB provides a host-side Wireless USB radio solution. It is intended to assist companies who are developing devices. It is not intended for companies developing host solutions.

For more information about what is shipped with the WHCI-based PDK, please click here.

The WHCI-based PDKs are available for US$1,500.00. To purchase the PDK, please fill out the PDK Product Order Form and fax or mail it to the address provided on the form.

Due to the limited supply, companies must meet certain eligibility criteria in order to purchase a PDK.

L800 - Known Good Device for Wireless USB Interoperability Testing

The L800 is a known good device that can be used to test interoperability of Wireless USB devices in a test environment. The L800 PCI adapter board inserts into a PCI slot, converting the standard PC into a Wireless USB mass storage device. It operates at all data rates, supports both cable and numeric association, and supplies both wired and wireless USB connections. The L800 ships with Native Device software and user documentation provided by LucidPort.

To purchase the L800, please fill out the USB Product Order Form and fax or mail it to the address provided on the form.

Error Vector Magnitude (EVM) Test Bed for Wireless USB Testing

The Error Vector Magnitude (EVM) Test Bed is used to analyze data gathered as part of the
Wireless USB electrical test procedures.

To purchase the EVM Test Bed, please fill out the USB Product Order Form and fax or mail it to the address provided on the form.

Compliance Tools for USB On-The-Go

USB OTG compliance requires OTG specific electrical and protocol tests to be performed. Two tools are available for validating OTG compliance as specified in the "USB On-The-Go Compliance Plan for the USB 2.0 Specification."

USB On-The-Go Electrical Tester (OET) -- ON BACKORDER

The OET verifies USB On-The-Go specific electrical test points. The OET is used for both full-speed and high-speed electrical compliance of USB OTG devices.

USB On-The-Go Protocol Tester (OPT) -- ON BACKORDER

The High-Speed OPT verifies both full-speed and high-speed USB On-The-Go protocol test points. Purchase this if your OTG designs include high-speed and full-speed. The HS OPT is also used to initiate test modes on high-speed embedded host controllers as defined in the EmbeddedHSET document.

The full-speed OPT is no longer available for purchase.

Due to timing sensitivities, the OPT requires special software to make Windows XP a "real-time" operating system. This software is included in the purchase of the OPT and is called RTX. There is no need to purchase RTX separately.

The installation utility for the OPT driver, application and test scripts can be downloaded from the USB On-The-Go webpage . Because there are two types of OPTs, please be sure to download the correct installation utility based on the signaling speed of your OPT.

To purchase the USB On-The-Go Compliance Test Kit, please fill out the USB Product Order Form and fax or mail it to the address provided on the form.

USB Functional Compliance Test Devices

The Functional Compliance Test Devices are designed to meet the requirements set forth in the USB2 Compliance Test Device Functional Specification, Revision 1.0. The test devices are used by the USB2 Transaction Translator Test Suite (USBHTT). The specification for the devices is available at http://developer.intel.com/technology/usb/spec.htm. The devices support a simple vendor command API that allows them to be used to deterministically test a wide variety of USB transfer and protocol scenarios. Full-speed Functional Compliance Test Devices are currently available. Low-speed Functional Compliance Test Devices are on backorder.

To purchase USB Functional Compliance Test Devices, please fill out the USB Product Order Form and fax or mail it to the address provided on the form.

USB Customer Hub (CHUB)

The CHUB has been discontinued. For compliance testing, we recommend you select a certified high-speed hub from the Integrators List. You may also use the Product Search on this site to identify certified high-speed hubs. A certified high-speed hub may be used in place of the CHUB in the USB-IF Compliance Test Procedure Revision 1.0rc2.

Hardcopy USB 2.0 Specification

Universal Serial Bus Revision 2.0 specification provides the technical details to understand USB requirements and design USB compatible products.

Modifications to the USB specification are made through Engineering Change Notices (ECNs). Included in the spec are three documents:

The original USB 2.0 specification released on April 27, 2000
Errata to the USB 2.0 specification as of December 7, 2000
Mini-B connector Engineering Change Notice to the USB 2.0 specification.

To purchase a hardcopy of the USB 2.0 Specification please fill out the USB Product Order Form and fax or mail it to the address provided on the form.

Hardcopy Wireless USB Specification

To purchase a hardbound copy of the Wireless Universal Serial Bus Specification Revision 1.0, please fill out the USB Product Order Form and fax or mail it to the address provided on the form.

Hardcopy USB 3.0 Specification

To purchase a hardcopy of the Universal Serial Bus 3.0 Specification Revision 1.0, please fill out the USB Product Order Form and fax or mail it to the address provided on the form.