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SuperSpeed USB Platform Interoperability Lab 

The SuperSpeed USB Platform Interoperability Lab (PIL) is available for assistance with SuperSpeed product development. The lab is open for USB-IF members only.  USB-IF members who wish to utilize the SuperSpeed USB Platform Interoperability Lab must complete the SuperSpeed USB PIL Lab Visit Request Form and the appropriate SuperSpeed USB checklist and submit both to admin@usb.org where a Test ID (TID) will be assigned to each SuperSpeed product and an appointment date will be scheduled for the USB 3.0 product.

To test the interoperability of devices and hosts submitted to the PIL, the lab will use a variety of certified SuperSpeed USB hosts and devices. 

Testing will be completed per the following USB 3.0 Product Test Matrix (Updated January 2, 2013)

xHCI host silicon, USB 3.0 hub silicon, SuperSpeed Embedded Host, and USB 3.0 compound devices can currently be tested at the PIL.  All other products should be submitted to an approved ITL for USB 3.0 certification. If a company wants to schedule certification or debug of a peripheral or host end product at the PIL, they must get permission from PIL.

Please contact one of the above authorized test labs directly to inquire about pricing and testing time.

SuperSpeed certification requires each USB 3.0 port to pass all required USB 2.0 compliance tests.  Thus, the approved test facility must satisfactorily perform all the appropriate USB 2.0 compliance tests on each USB 3.0 port.  The approved test lab must also satisfactorily perform all USB 3.0 electrical tests and USB30CV Chapter 9 tests, including appropriate class tests, on each USB 3.0 port. 

SuperSpeed USB Tools including USB 3.0 Certification Platform information can be found here

SuperSpeed USB Testing Specifications and Procedures can be found here.

To plan a visit to the SuperSpeed USB Platform Interoperability Lab, return the completed SuperSpeed USB Platform Interoperability Lab Visit Request Form and SuperSpeed USB checklist to admin@usb.org.