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USB Platform Interoperability Lab 

The USB Platform Interoperability Lab (PIL) is available for assistance with USB 3.1 product development. The lab is open for USB-IF members only.  USB-IF members who wish to utilize the USB Platform Interoperability Lab must complete the USB PIL Lab Visit Request Form and the appropriate USB checklist and submit both to where a Test ID (TID) will be assigned to each product and an appointment date will be scheduled.

To test the interoperability of devices and hosts submitted to the PIL, the lab will use a variety of certified USB hosts and devices.

PIL slots can be scheduled for certification testing or information only testing.  PIL will allocate staff to run all certification tests for a certification slot.  For an information only slot, PIL staff will be available for questions and testing demonstration, but it is assumed that the vendor will provide an engineer to run tests and debug failures. 

Confidentiality Policy

We remind each attendee that your company (including for its employees, consultants, or other persons acting on your company’s behalf) has already agreed and is bound to the USB-IF Policy Regarding Confidential Information. Among other things, this policy requires confidential treatment of “information learned or obtained through compliance programs or testing,” which includes your participation in testing at the PIL. Please note that other companies may be present and that information about those companies’ activities or products should be handled with appropriate confidentiality. Beginning September 2017 PIL will routinely be scheduled with more than 1 test slot at a time.  If you have questions about this please contact

USB Type-C™ and USB Power Delivery
PD 3.0 Silicon and PD 3.0 Power Bricks (with or without PPS) can be scheduled for certification testing at PIL.  For PD 3.0 Silicon and PD 3.0 Power Bricks (with or without PPS) all PD2.0 Certification testing must be completed at authorized ITL's.

Please review the PIL testing categories chart located here.

SuperSpeed USB 10Gbps (USB 3.1 Gen 2)
xHCI 1.1 host silicon, USB 3.1 Gen 2 hubs and hub silicon, USB 3.1 Gen 2 peripherals and peripheral silicon can be scheduled for certification or information only testing. Please complete the PIL request form to request scheduling.  USB 2.0 and Gen 1 testing must be completed at an approved ITL.
Pease contact one of the authorized test labs directly to inquire about pricing and testing time.   

Testing will be completed per the following USB 3.2 Product Test Matrix (Updated March 19, 2018) and USB Type-CTM Product Matrix. (Updated January 19, 2017)

SuperSpeed certification requires each USB 3.0 port to pass all required USB 2.0 compliance tests.  Thus, the approved test facility must satisfactorily perform all the appropriate USB 2.0 compliance tests on each USB 3.0 port.  The approved test lab must also satisfactorily perform all USB 3.0 electrical tests and USB30CV Chapter 9 tests, including appropriate class tests, on each USB 3.0 port. 

USB Type-CTM Testing Specifications and Procedures can be found here.

SuperSpeed USB Tools including USB 3.0 Certification Platform information can be found here

SuperSpeed USB Testing Specifications and Procedures can be found here.