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USB Platform Interoperability Lab 

The USB Platform Interoperability Lab (PIL) is available for assistance with SuperSpeed and SuperSpeed USB 10Gbps product development. The lab is open for USB-IF members only.  USB-IF members who wish to utilize the USB Platform Interoperability Lab must complete the USB PIL Lab Visit Request Form and the appropriate USB checklist (when applicable) and submit both to where a Test ID (TID) will be assigned to each product and an appointment date will be scheduled.

To test the interoperability of devices and hosts submitted to the PIL, the lab will use a variety of certified USB hosts and devices.

Products with USB Type-CTM connectors can be schedule for info-only testing at PIL. 

SuperSpeed USB 10Gbps (USB 3.1 Gen 2)
xHC 1.1 host silicon and USB 3.1 Gen 2 peripherals can be scheduled for certification or info-only testing. Please complete the PIL request form to request scheduling. USB 3.1 Gen 2 hubs can be scheduled for info-only testing. 

SuperSpeed USB (USB 3.0/USB 3.1 Gen 1)
xHCI 1.0 host silicon, USB 3.0 hub silicon, SuperSpeed Embedded Host, and USB 3.0 compound devices can currently be tested at the PIL.  All other products should be submitted to an approved ITL for USB 3.0 certification. If a company wants to schedule certification or debug of a peripheral or host end product at the PIL, they must get permission from PIL.

Please contact one of the above authorized test labs directly to inquire about pricing and testing time.

Testing will be completed per the following USB 3.1 Product Test Matrix (Updated November 17, 2015)

SuperSpeed certification requires each USB 3.0 port to pass all required USB 2.0 compliance tests.  Thus, the approved test facility must satisfactorily perform all the appropriate USB 2.0 compliance tests on each USB 3.0 port.  The approved test lab must also satisfactorily perform all USB 3.0 electrical tests and USB30CV Chapter 9 tests, including appropriate class tests, on each USB 3.0 port. 

SuperSpeed USB Tools including USB 3.0 Certification Platform information can be found here

SuperSpeed USB Testing Specifications and Procedures can be found here.